ADMIRE PROJECT

• About
• Project Detail
• Benefit for Companies
• Equipments
• Post Program
• People
• Application
• Contact

ADMIRE PROJECT at Institute of Advanced Energy (IAE) in Kyoto University is a MEXT supported program "Open Advanced Facilities Initiative for Innovation (Strategic Use by Industry)" for 5 years to delivery of science and technology from Kyoto University to companies. ADMIRE provides and supports companies to utilize advanced facilities, such as DuET and MUSTER, IAE, Kyoto University for acceleration of  cooperative research and developments among industries and IAE-Kyoto University. ADMIRE PROJECT provides services to utilize the equipments such as TEM, SEM and ion accelerators with free of charge for maximum 2 years.

Project Details

Application of DuET and MUSTER for Industrial Research and Engineering (ADMIRE) PROJECT launched in 2006 and continues for 5 years funded by Ministry of Education, Culture, Sports, Science and Technology (MEXT) of JAPAN. DuET and MUSTER are representing facilities in Institute of Advanced Energy (IAE) at Kyoto University dedicated for the research of energy science and technology, with the special emphasis on fusion and fission materials R & Ds. ADMIRE PROJECT aims to delivery the research resources of IAE to public. Thus, programs to be approved are NOT restricted within fission and fusion materials, nor energy science and technology. We expect many proposals from varieties of fields all over the world. Users can use the facilities with free of charge.

Trial Use for Industry

This area is flexible to accept any new ideas from industries for supporting their efforts to make progress. Applicants are able to choose collaboration or simple utilization of the facilities. The collaboration is handled under the standard Industry-Kyoto University collaboration procedure. The simple utilization of the facilities is available for companies having seeds of new products or very basic R & Ds. The simple utilization (non-collaborative utilization) is allowed for the applicant to hold all the Intellectual Properties from the activities. ADMIRE project nor IAE never demands right of Intellectual Property arising from the activities for the case of simple utilization. The Project provides services for contributing innovation of science and technology. The period of use in this area is 6 months, and optionally extension of 6 months will be available.

The invitation of the application will be made 2 times annually at spring and autumn. All users need to make report of the activity at the end of each program to MEXT. The report is open to the public. However, under special circumstances, the report might be waived maximum for 2 years for the protection of Intellectual Property. Also, the title and the content of the activity may be classified upon the request of the applicant.

Benefits for Companies

1. Rapid progress of products development by use of high performance equipments.

2. Reduction of expenditure for equipments.

3. Rapid investigation of new idea.

4. Use of very expensive equipments.

5. Access to excellent faculties and research resources at IAE.

Equipments

DuET (Dual-Beam Irradiation Facility for Energy Science and Technology)

DuET is the facility with 1.7 MeV Tandem and 1 MeV Single-end accelerators. A spatter ion source for varieties of charged particles and a duo-plasma ion source for helium are installed in the Tandem accelerator. The Single-end accelerator, currently, only provides helium ions. Simultaneous dual-ion irradiation is available. Two target stations named DuMIS(Dual Ion Material Irradiation Station) and HiMAS (High Temperature Material Analysis Station) are equipped. The irradiation temperature covers 10 K to 1873 K. 

MUSTER(Multi-scale testing and evaluation research) Facility

· Field Emission Transmission Electron Microscope (JEOL JEM-2200FS)

This microscope is designed for both high resolution TEM/STEM and analytical microscopy with a 200kV field emission gun (FEG).  Point and line resolutions are 0.23 nm and 0.1 nm, respectively. The specimen holder is a double tilt holder (x ±35°, y ±30°). The attachments of this microscope are: (1) Electron dispersion X-ray analysis system (EDX) for chemical analysis, (2) Electron energy-loss spectroscopy (EELS) with the omega filter system. (3) A scanning unit with a high-angle annular dark-field (HAADF) detector for scanning TEM (Z-contrast imaging)

· Transmission Electron Microscope (JEOL JEM-2010)

This microscope is a 200 kV conventional TEM with a LaB6 emitter. Point and line resolutions are 0.25 nm and 0.14 nm, respectively. The main specimen holder is a GATAN double tilt analytical holder (x ±60°, y ±30°). This microscope is very available for material science researches. The other two specimen holders of GATAN single tilt heating holder up to 1573 K and single tilt straining holder are available.

· Focused Ion Beam Processing Device (JEOL JIB-4500 & Micrion/JEOL JFIB 2100)

Micrion JFIB 2100 is mainly used for the preparation of specimens of SEM and TEM. This device is able to fabricate and polish samples. FIB processing is available for metals, ceramics and composites. With using a micro-pick up system, the users can choose the fabrication area anywhere on a sample.

· Field Emission Scanning Electron Microscope (Zeiss ULTRA55 & JEOL JSM-7500F)

This microscope is a field emission scanning electron microscope (FE-SEM) incorporating a cold cathode field emission gun. Voltage range is from 0.5 kV to 30 kV. The resolution is 1 nm at 15 kV. The attachments of this SEM are (1) Electron dispersion X-ray analysis system (EDX) for chemical analysis (2) Back scattering detector for Z-imaging.

Post Program

DuET and MUSTER facilities are available for the cost of utilization. After the activities under ADMIRE project with free of charge, the users can continue the activities onerous way with very reasonable burden. The cost will be charged by Kyoto University under the Kyoto University charging policy. The typical charging rate is listed the below for the case of collaborative utilization (in the bracket: for the case of non-collaborative utilization).

Charge rate

Application

- Copyright © 2007 Institute of Advanced Energy. Kyoto University -